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3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Dedicated power supply for the

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Dedicated power supply for theC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

SKU: 54874758600 · From clintoncounty708.com

4.9
USD10375.00 USD10417.00

Pay in 4 interest-free payments of $2593.75 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 10 - Aug 15

Description

Dedicated power supply for the CLAMP ON PROBE 3273-50/3274/3275/3276

"Soft Start" Function

High Resolution analog Unit (2 channel) 1MS/s 100kHz Bandwidth

Temperature / Voltage Unit for MR8847

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Dedicated power supply for theC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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